Microscopy Books

INSTRUMENTATION & METHODS

Super-resolution structured illumination microscopy (part 2) [2022]

Edited by: Kirti Prakash, Benedict Diederich, Stefanie Reichelt, Rainer Heintzmann and Lothar Schermelleh
2022
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Super-resolution structured illumination microscopy (part 1) [2021]

Edited by: Kirti Prakash, Benedict Diederich, Stefanie Reichelt, Rainer Heintzmann and Lothar Schermelleh
2021
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Bioimage Data Analysis Workflows [2020]

Bioimage analysis is a powerful way to quantify properties of biological systems. Many software tools are available for this, but how to combine various implemented algorithms to address biological questions remains challenging. The textbook "Bioimage Data Analysis Workflows" shows representative examples of bioimage analysis workflows, filling this gap between the computer science solutions and the life scientists' practice. The online open access version is available to be downloaded and used to learn practical workflows step by step. Please download at:

Author: Kota MiuraNataša Sladoje
Published by: Springer, Cham
2020
ISBN: 978-3-030-22386-1
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Unbiased Stereology [2018]

Three Dimensional Measurement in Microscopy

Author: C.V. Howard & M.G. Reed
2018
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Atom-Probe Tomography: Putting theory into practice [2016]

Author: Williams Lefebvre, Francois Vurpillot, Xavier Sauvage
Edited by: Elsevier
2016
ISBN: 9780128046470
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Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction [Second Edition] [2015]

30% off with the code: WS15XMAS30

Author: Rolf Erni
Published by: World Scientific Publishing Co.
2015
ISBN: 978-1-84816-536-6
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Atom-Probe Tomography: The Local Electrode Atom Probe [2014]

Author: Miller, Michael K., Forbes, Richard G.
Edited by: Springer
2014
ISBN: 978-1-4899-7429-7
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Local Electrode Atom Probe Tomography [2013]

Author: Larson, D.J., Prosa, T.J., Ulfig, R.M., Geiser, B.P., Kelly, Th.F.
Edited by: Springer
2013
ISBN: 978-1-4614-8720-3
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Atom Probe Microscopy [2012]

Author: Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P.
Edited by: Springer
2012
ISBN: 978-1-4614-3436-8
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Focus on Recent advances in (S)TEM and related spectroscopies: a tribute to C. Colliex [2011]

vol. 54, issue 03, June 2011

Edited by: Serin, V., Stephan, O., Kociak, M. and Buffat, P.
Published by: The European Physical Journal Applied Physics
2011
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http://www.epjap.org/action/displayIssue?decade=2010&jid=JAP&volumeId=54&issueId=03&iid=8296148
Scanning Transmission Electron MicroscopyImaging and Analysis [2011]

Edited by: Stephen J. Pennycook ; Peter D. Nellist
Published by: Springer
2011
ISBN: 978-1-4419-7199-9
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Aberration-corrected Analytical Electron Microscopy [2011]

Edited by: A. Bleloch, L.M. Brown, R. Brydson, A.J. Craven, P.J. Goodhew, S. Haigh, A. Kirkland, P. Nellist, M. Shannon and G. Tatlock
Published by: Wiley
2011
ISBN: 978-0-470-51851-9
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Electron Energy-loss Spectroscopy in the Electron Microscope, 3rd ed. [2011]

Edited by: R.F. Egerton
Published by: Springer
2011
ISBN: 978-1-4419-9582-7
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Scanning Probe Microscopy [2011]

Edited by: N. Tomczak and K.E.J. Goh
Published by: World Scientific Publishing
2011
ISBN: 978-981-4324-76-2
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Holographic Microscopy of Phase Microscopic Objects, Theory and Practice [2011]

Edited by: T. Tishko, D. Tishko and V. Titar
Published by: World Scientific Publishing
2011
ISBN: 978-981-4289-54-2
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Mathematical Morphology and its Applications to Image and Signal Processing [2011]

Edited by: P. Soille, M. Pesaresi and G.K. Ouzounis
Published by: Springer
2011
ISBN: 978-3-642-21568-1
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Handbook of Mathematical Methods in Imaging [2011]

Edited by: O. Scherzer
Published by: Springer
2011
ISBN: 978-0-387-92919-4
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Mathematical Image Processing [2011]

Edited by: M. Bergounioux
Published by: Springer
2011
ISBN: 978-3-642-19603-4
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Elements of Modern X-ray Physics [2011]

Edited by: J. Als-Nielsen and D. McMorrow
Published by: Wiley
2011
ISBN: 978-0-470-97395-0 (hardcover) ; 978-0-470-97394-3 (paperback)
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Phase-space optics, Fundamentals and Applications [2010]

Edited by: M. Testorf, B. Hennelly and T. Ojeda-Castañeda
Published by: Pan Stanford Publishing
2010
ISBN: 978-9814267489
Progress in Optics [2010]

Edited by: E. Wolf
Published by: Elsevier
2010
ISBN: 978-0-444-53705-8
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The Light Fantastic: A Modern Introduction to Classical and Quantum Optics [2010]

Edited by: I.R. Kenyon
Published by: Oxford University Press
2010
ISBN: 978-0-19-958461-1 (hardback) ; 978-0-19-958460-4 (paperback)
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Mathematical Morphology, from Theory to Applications [2010]

Edited by: L. Najman and H. Talbot
Published by: Wiley
2010
ISBN: 978-1-84821-215-2
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Linear and Chiral Dichroism in the Electron Microscope [2010]

December

Author: Peter Schattschneider
Published by: Pan Stanford Publishing
2010
ISBN: 978-9814267489
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Nanoscopy and Multidimensional Optical Fluorescence Microscopy [2010]

Edited by: Alberto Diaspro
Published by: CRC Press
2010
ISBN: 978-1-400-7886-2
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Introduction to Nanophotonics [2010]

Author: Sergey V. Gaponenko
Published by: Cambridge University Press
2010
ISBN: 9780521763752
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Image Processing: The Fundamentals [2010]

Author: Maria Petrou, Costas Petrou
Published by: Wiley
2010
ISBN: 978-0-470-74586-1
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Atomic Force Microscopy [2010]

Author: Peter Eaton and Paul West
Published by: Oxford University Press
2010
ISBN: 978-0-19-957045-4
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Nanoscopy and Multidimensional Optical Fluorescence Microscopy [2010]

Edited by: Alberto Diaspro, University of Genoa, Italy
Published by: CRC Press, Taylor & Francis Group
2010
ISBN: 978-1420-07886-2 / ISBN 10: 1420078860
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Advanced Computing in Electron Microscopy, 2nd ed. [2010]

Author: Earl J. Kirkland
Published by: Springer
2010
ISBN: 978-1-4419-6532-5
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Electron Crystallography, Electron Microscopy and Electron Diffraction [2010]

Author: X. Zou, S. Hovmöller and P. Oleynikov
Published by: Oxford University Press
2010
ISBN: 978-0-19-958020-0
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New Horizons of Applied Scanning Electron Microscopy [2010]

Author: Shimizu, Kenichi; Mitani, Tomoaki
Published by: Springer
2010
ISBN: 978-3-642-03159-5
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Near Field Emission Scanning Electron Microscopy [2010]

Author: Taryl L. Kirk
Published by: Logos Verlag Berlin
2010
ISBN: 978-3-8325-2518-7
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Sample Preparation Handbook for Transmission Electron Microscopy, 2 vols [2010]

Edited by: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret and D. Laub
Published by: Springer
2010
ISBN: 978-1-4419-6087-0 (2-vol set); 978-0-387-98181-9 (Vol. 1), 978-1-4419-5974-4 (Vol. 2)
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Scanning Electron Microscope Optics and Spectrometers [2010]

Author: A. Khursheed
Published by: World Scientific Publishing Co.
2010
ISBN: 978-981-283-667-0
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Towards an unambiguous Electron Magnetic Chiral Dichroism (EMCD) measurement in a Transmission Electron Microscope (TEM) [2009]

Author: Christian Hurm
Published by: Logos Verlag Berlin
2009
ISBN: 978-3-8325-2108-0
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Geometrical Charged-particle Optics [2009]

Author: Harald H. Rose
Published by: Springer
2009
ISBN: 978-3-540-85915-4
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4D Electron Microscopy, Imaging in Space and Time [2009]

December

Author: Ahmed H Zewail and John M Thomas
Published by: Imperial College Press Co.
2009
ISBN: 978-1-84816-390-4 (cloth), 978-1-84816-400-0 (paper)
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An Introduction to Microscopy [2009]

October

Author: Suzanne Bell and Keith Morris
Published by: CRC Press, London, UK
2009
ISBN: 9781420084504
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New possibilities with aberration-corrected electron microscopy [2009]

Editors: David Cockayne, Angus Kirkland, Peter Nellist and Andrew Bleloch

Published by: Royal Society Publishing, London, UK
2009
ISBN: 9780854037698
EMS reduction: please contact the EMS secretary for reduction code
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In Situ Electron Microscopy at High Resolution [2009]

Edited by: Florian Banhart
Published by: World Scientific Publishing Co.
2009
ISBN: 978-981-279-733-9
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LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION (LACBED) [2009]

Edited by: Jean-Paul Morniroli
Published by: Sfµ (Société française des Microscopies)
2009
ISBN: -
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Histoire de CAMECA (1954-2009), Voyage au Village des Ingénieurs Gaulois [2009]

Author: E. de Chambost
2009
ISBN: 978-2-7466-1649-3
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Scientific Research in World War II. What Scientists did in the War [2009]

Author: A. Mass and H. Hooijmaijers
Published by: Routledge
2009
ISBN: 978-0-7103-1340-9
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis [2009]

Author: Echlin, Patrick
Published by: Springer
2009
ISBN: 978-0-387-85730-5
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Applied Scanning Probe Methods XI [2009]

Scanning Probe Microscopy Techniques

Author: Bhushan, Bharat; Fuchs, Harald (Eds.)
Published by: Springer
2009
ISBN: 978-3-540-85036-6
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Applied Scanning Probe Methods XII [2009]

Characterization

Author: Bhushan, Bharat; Fuchs, Harald (Eds.)
Published by: Springer
2009
ISBN: 978-3-540-85038-0
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Applied Scanning Probe Methods XIII [2009]

Biomimetics and Industrial Applications

Author: Bhushan, Bharat; Fuchs, Harald (Eds.)
Published by: Springer
2009
ISBN: 978-3-540-85048-9
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Advances in Imaging and Electron Physics Volume 159 [2009]

The scanning transmission electron microscope

Edited by: Peter W. Hawkes
Published by: Elsevier Inc.
2009
ISBN: 978-0-12-374986-4
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Advances in Imaging and Electron Physics Volume 153 [2008]

Aberration-corrected microscopy

Edited by: Peter W. Hawkes
Published by: Elsevier Inc.
2008
ISBN: 978-0-12-374220-9
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Applied Scanning Probe Methods IX [2008]

Characterization

Author: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
Published by: Springer
2008
ISBN: 978-3-540-74082-7
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Applied Scanning Probe Methods VIII [2008]

Scanning Probe Microscopy Techniques

Author: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
Published by: Springer
2008
ISBN: 978-3-540-74079-7
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Applied Scanning Probe Methods X [2008]

Biomimetics and Industrial Applications

Author: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
Published by: Springer
2008
ISBN: 978-3-540-74084-1
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Applied Charged Particle Optics [2008]

Author: Liebl, Helmut
Published by: Springer
2008
ISBN: 978-3-540-71924-3
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Transmission Electron Microscopy [2008]

Physics of Image Formation

Author: Reimer, L., Kohl, H.
Published by: Springer
2008
ISBN: 978-0-387-40093-8
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Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM) [2008]

Author: Debbie Stokes
Published by: John Wiley & Sons, Inc
2008
ISBN: 978-0-470-06540-2
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Advances in Imaging & Electron Physics, vol. 153 [2008]

Aberration-corrected Electron Microscopy

Author: P.W. Hawkes (Ed.)
Published by: Elsevier
2008
ISBN: 978-0-12-374220-9
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Guide de Préparation des Echantillons pour la Microscopie Electronique en Transmission, 2 vols [2007]

Edited by: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret and D. Laub
Published by: l’Université de Saint-Etienne
2007
ISBN: 978-2-86272-441-6 and 978-2-86272-442-3
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Electron Microscopy [2007]

Methods and Protocols, 2nd ed.

Edited by: Kuo, John
Published by: Springer
2007
ISBN: 978-1-58829-573-6
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Scanning Microscopy for Nanotechnology [2007]

Techniques and Applications

Edited by: Zhou, Weilie; Wang, Zhong Lin (Eds.)
Published by: Springer
2007
ISBN: 978-0-387-33325-0
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Science of Microscopy (2nd printing) [2006]

2nd printing, 2007

Author: Hawkes, Peter W.; Spence, John C.H. (Eds.)
Published by: Springer
2006
ISBN: 978-0-387-25296-4
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Image Processing: Dealing With Texture [2006]

January

Author: Maria Petrou, Pedro Garcia Sevilla
Published by: Wiley
2006
ISBN: 978-0-470-02628-1
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Dictionary of Microscopy [2005]

August

Author: Julian P. Heath
Published by: John Wiley & Sons, Ltd
2005
ISBN: 978-0-470-01199-7
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An Introduction to the Passage of Energetic Particles through Matter

ISBN 10: 0750309350

Author: N.J Carron
Published by: CRC Press, Taylor & Francis Group
ISBN: 9780750309356
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MATERIALS SCIENCE & PHYSICSTop

Handbook of Sample preparation for Transmission Electron Microscopy [2010]

For Materials Science and Biology
Vol. 1. Methodology

Author: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret et D. Laub
Published by: Springer
2010
ISBN: 978-0-387-98181-9
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Handbook of Sample preparation for Transmission Electron Microscopy [2010]

For Materials Science and Biology
Vol. 2. Techniques

Author: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret et D. Laub
Published by: Springer
2010
ISBN: 978-1-4419-5974-4
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These hanbooks are related to the website: http://temsamprep.in2p3.fr/
TEM Investigations on Magnetic and Structural Phase Transitions at Low Temperatures [2009]

Author: Jürgen Gründmayer
Published by: Logos Verlag Berlin
2009
ISBN: 978-3-8325-2270-4
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Geomaterials Under the Microscope - A colour guide [2009]

Building stone, roofing slate, aggregate, concrete, mortar, plaster, bricks, ceramics and bituminous mixtures

Author: Jeremy Ingham
Published by: Manson Publishing Ltd, London, UK
2009
ISBN: 978-1-84076-132-0
EMS reduction: please contact the EMS secretary for reduction code
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Handbook of Surface and Interface Analysis (2nd edn) [2009]

Author: J.C. Rivière and S. Myhra
Published by: CRC Press
2009
ISBN: 978-0-8493-7558-3
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3D Images of Materials Structures: Processing and Analysis [2009]

Author: Joachim Ohser and Katja Schladitz
Published by: Wiley-VCH Verlag GmbH
2009
ISBN: 978-1-84076-132-0
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Transmission Electron Microscopy [2009]

A Textbook for Materials Science

Author: Williams, David B., Carter, C. Barry
Published by: Springer
2009
ISBN: 978-0-387-76500-6 (cloth), 978-0-387-76502-0 (paper)
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Scientific Research in World War II. What Scientists did in the War [2009]

Author: A. Mass and H. Hooijmaijers
Published by: Routledge
2009
ISBN: 978-0-7103-1340-9
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Advanced Tomographic Methods in Materials Research and Engineering [2008]

Author: J. Banhart
Published by: Oxford University Press
2008
ISBN: 978-0-19-921324-5
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Microstructural Characterization of Materials [2008]

Author: D. Brandon and W.D. Kaplan
Published by: Wiley-VCH Verlag GmbH & Co
2008
ISBN: 978-0-470-02784-4 (cloth), 97800-470-02785-1 (paper)
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Transmission Electron Microscopy and Diffractometry of Materials, 3rd ed. [2008]

Author: Fultz, Brent and Howe, James
Published by: Springer
2008
ISBN: 978-3-540-73885-5
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Morphological Image Analysis [2003]

Author: P. Soille
Published by: Springer
2003
ISBN: 978-3-540-42988-3 (hardcover) ; 978-3-642-07696-1 (softcover)
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LIFE SCIENCESTop

GREEN UNIVERSE [2012]

A Microscopic Voyage into the Plant Cell

Author: Stephen Blackmore
Published by: Papadakis
2012
ISBN: 978-1-906506-21-6
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Immunoelectron Microscopy [2010]

Methods and Protocols

Edited by: Steven D. Schwartzbach ; Tetsuaki Osafune
Published by: Springer
2010
ISBN: 978-1-60761-782-2
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Membrane Protein Structure Determination [2010]

Methods and Protocols

Edited by: Jean-Jacques Lacapère
Published by: Springer
2010
ISBN: 978-1-60761-761-7
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Handbook of Sample preparation for Transmission Electron Microscopy [2010]

For Materials Science and Biology
Vol. 1. Methodology

Author: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret et D. Laub
Published by: Springer
2010
ISBN: 978-0-387-98181-9
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Handbook of Sample preparation for Transmission Electron Microscopy [2010]

For Materials Science and Biology
Vol. 2. Techniques

Author: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret et D. Laub
Published by: Springer
2010
ISBN: 978-1-4419-5974-4
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These hanbooks are related to the website: http://temsamprep.in2p3.fr/
ATOMIC FORCE MICROSCOPY FOR BIOLOGISTS [2009]

Second Edition

Edited by: Victor J Morris, Andrew R Kirby & A Patrick Gunning
Published by: World Scientific Publishing Co.
2009
ISBN: 978-1-84816-467-3
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Biological Low-Voltage Scanning Electron Microscopy [2008]

Author: Schatten, Heide; Pawley, James B. (Eds.)
Published by: Springer
2008
ISBN: 978-0-387-72970-1
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Electron Crystallography of Biological Macromolecules [2007]

May

Edited by: R.M. Glaeser, K. Downing, D. DeRosier, W. Chiu and J. Frank
Published by: Oxford University Press
2007
ISBN: 978-0-19-508871-7
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Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry [1997]

Editors: S. Amelinckx, Dirk Van Dyck, J. van Landuyt, G. Van Tendeloo

Published by: Wiley-VCH Verlag GmbH
1997
ISBN: 3-527-29293-4
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